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van der Waals Bonded Co/h-BN Contacts to Ultrathin Black Phosphorus Devices

机译:van der Waals Bonded Co / h-BN与超薄黑磷的接触   设备

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摘要

Due to the chemical inertness of 2D hexagonal-Boron Nitride (h-BN), fewatomic-layer h-BN is often used to encapsulate air-sensitive 2D crystals suchas Black Phosphorus (BP). However, the effects of h-BN on Schottky barrierheight, doping and contact resistance are not well known. Here, we investigatethese effects by fabricating h-BN encapsulated BP transistors with cobalt (Co)contacts. In sharp contrast to directly Co contacted p-type BP devices, weobserve strong n-type conduction upon insertion of the h-BN at the Co/BPinterface. First principles calculations show that this difference arises fromthe much larger interface dipole at the Co/h-BN interface compared to the Co/BPinterface, which reduces the work function of the Co/h-BN contact. The Co/h-BNcontacts exhibit low contact resistances (~ 4.5 k-ohm), and are Schottkybarrier free. This allows us to probe high electron mobilities (4,200 cm2/Vs)and observe insulator-metal transitions even under two-terminal measurementgeometry.
机译:由于2D六方氮化硼(h-BN)的化学惰性,很少使用原子层h-BN来封装对空气敏感的2D晶体,例如黑磷(BP)。然而,h-BN对肖特基势垒高度,掺杂和接触电阻的影响尚不清楚。在这里,我们通过制造具有钴(Co)触点的h-BN封装的BP晶体管来研究这些效应。与直接Co接触的p型BP器件形成鲜明对比的是,当h-BN插入Co / BP界面时,我们观察到强n型传导。第一性原理计算表明,这种差异是由于Co / h-BN界面处的Co / h-BN界面处的界面偶极子更大,从而降低了Co / h-BN触点的功函数。 Co / h-BN触点显示出低接触电阻(〜4.5 k-ohm),并且无肖特基势垒。这使我们能够探测高电子迁移率(4,200 cm2 / Vs)并观察绝缘子-金属的跃迁,即使在两端子测量几何结构下也是如此。

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